$171,540

KLA-Tencor Surfscan 6220 (SFS6220)

The Surfscan 6220 (SFS6220) wafer surface defects analysis system. The Surfscan 6220 (SFS6220) system is used for wafer surface contamination analysis of unpatterned semiconductor wafers. Condition: refurbished, operational, calibrated and tested. Ready for delivery, crated. Installation and training services are available. Please contact us if interested in the Surfscan 6220 or any other refurbished Surfscan systems (6100, 6200, 6220, 6400, 6420, SP1/TBI) via email a@semiphoton.com or website www.semiphoton.com Thank you! Specifications: • Substrate Sizes: 50mm(2"), 76mm(3"), 100mm(4"), 125mm(5"), 150mm(6"), 200mm(8") wafers • Substrate Material: Silicon or any opaque, polished surface which scatters less than 5% of incident light. • Defect Sensitivity: 0.10µm diameter PSL sphere equivalent with greater than 90% capture rate. • Haze Sensitivity: 0.02ppm • Haze Resolution: 0.002ppm • Repeatability: 0.5% at 1σ (mean count greater than 500, 0.364 µm diameter latex spheres) • Dynamic Range: 0.01µm to 9,999µm in a single measurement.

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